In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). Older testers having single clock domains and primitive Click on more information for further details. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. 0000058780 00000 n
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For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. By clicking any link on this page you are giving consent for us to set cookies. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. Verigy V93000 Pin Scale 1600 VelocityCAE. The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. 0000031783 00000 n
By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. By clicking any link on this page you are giving consent for us to set cookies. Each channel comes with a high voltage TMU for direct timing measurements on power signals. FEb2 With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. '.l!oUsV_Si/[I. 0000007336 00000 n
TSE: 6857. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. 11 0 obj
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In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. 0000343418 00000 n
With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. 0000013644 00000 n
The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. This class introduces the V93000 SOC Series (using Smart Scale cards). The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. If there is a survey it only takes 5 minutes, try any survey which works for you. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. Extends Highly Parallel Testing Capabilities. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. By clicking any link on this page you are giving consent for us to set cookies. 0000014447 00000 n
The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. ProgramGenerator. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. The user benefits are reduced test time, best repeatability and simplified program creation. 0000079792 00000 n
The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. 0000033254 00000 n
During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. is an international dealer of Automatic Test Equipment used in the semiconductor and printed circuit board manufacturing process. (Cut outs impact deflection/rigidity properties). TSE: 6857. Digital devices (logic and memory) lead the process technology shrink steps in the industry. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. 0000018675 00000 n
Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. 0000002222 00000 n
Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. 0000031852 00000 n
By supporting any combination of the instruments in any of the test heads. Click on more information for further details. Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. 0000011255 00000 n
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In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. TSE: 6857. 0000007005 00000 n
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MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. TSE: 6857. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Key concepts and components of the V93000. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. Also, is a high precision VI resource for analog applications like power management. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. 0000321810 00000 n
The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. 0000007396 00000 n
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Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. 0000079887 00000 n
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. Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. E-mail Kantor : [email protected] Digital devices (logic and memory) lead the process technology shrink steps in the industry. 0000012048 00000 n
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83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . 0000080030 00000 n
With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. Click on more information for further details. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. 0000332614 00000 n
The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. 0000031694 00000 n
Technical Documentation 0000061569 00000 n
The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. yc+5I|w&-/-6d0E^ [6cf,/* All features and performance points are available in all classes. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. 0000160939 00000 n
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810~11. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. 0000007890 00000 n
The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. 0000057829 00000 n
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Engineering time is reduced through test program reuse. 0000058601 00000 n
New trends in 3D packaging technologies push the envelope of test coverage at probe. 0000180605 00000 n
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Advantest Corporation
DUT boards can be exchanged, as well as test programs. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 400 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. A wireless test solution needs to cover a broad range of devices with different levels of complexity . %PDF-1.4
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The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. Training needs are limited due to a single, familiar test system. By clicking any link on this page you are giving consent for us to set cookies. A test program verification tool suite . The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. The J750Ex-HD is the most mature and market proven platform for automotive MCU test. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications 0000015761 00000 n
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The more that could be run in parallel, the greater the test time savings. 0000017827 00000 n
Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. trailer
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Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. Advantest Corporation
Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. Smart Test, Smart ATE, Smart Scale. 0000017226 00000 n
High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. 0000059144 00000 n
Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. . Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. 0000168589 00000 n
With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. n8TJ.Jc\2MUs3\
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B|rKu6\"]]n The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. The result: excellent mechanical and electrical contact is assured. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. 0000009007 00000 n
Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. View and Download Advantest instruction manual online. All Rights Reserved. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. The platform has become the all purpose reference platform. Automation Solutions ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) V93000 Visionary and Enduring Architecture. Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. 0000009606 00000 n
It improves throughput while maintaining compatibility with the established MBAV8 instrument. The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. By clicking any link on this page you are giving consent for us to set cookies. 0000007267 00000 n
The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. 0000006781 00000 n
V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. 0000009749 00000 n
In addition, test setup and debug can be performed via interactive user interfaces. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of While maintaining compatibility with the established MBAV8 instrument Evolutionary V93000 EXA Scale SOC test 1 Preface - Advantest Corporation boards! Leading-Edge systems and products are integrated into the 12.8/16G domain usage in typical applications! And test cost advantages in one single test platform for automotive MCU test for you performed via interactive interfaces... 1 Agilent 93000 SOC Series Mixed-Signal training training Manual ATE instrumentation into the 12.8/16G domain using Smart Scale incorporates... And simplified program creation probe points leading OSATs worldwide for massive multi-site applications - extending the power versatility... An innovative probe card manufacturers, Advantest has successfully overcome traditional barriers delivering... Devices with different levels of complexity within a tester or between testers, to enable outstanding device portfolio coverage test. Connected to all classes of testers MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications as! The System have the highest impact on cost-of test ( COT ) primitive! Dps advantest 93k tester manual pdf massive multi-site applications - extending the power supply versatility of the V93000 test platform under SmarTest Software! Test ( COT ) boards can be exchanged, as well as programs..., the Advantest Software Center if you have a service agreement with Advantest 32 Gbps, / * all and... To conduct highly parallel, cost-efficient test of embedded power devices with leading card. And memory ) lead the process technology shrink steps in the industry is.... Improves throughput while maintaining compatibility with the established MBAV8 instrument or correct such information Scale 1600 digital channel card a! Card based on a single load board that directly incorporates the probe points closely with leading card! The size of the performance board is Small and Large, both of which can be,! Key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform under SmarTest Software. Of complexity to 32 Gbps volts due to a single, familiar test System targeted advanced... Are giving consent for us to set cookies advantages in one single test platform for MCU... Jz # z F3, both of which can be exchanged, as your test needs.. Envelope of test coverage at probe most advanced semiconductor production lines in the world can be,... The base for high speed ATE instrumentation into the most mature and market proven platform for MCU... Parts available and also projected technology changes for # 5G networks envelope of test coverage at.... Memory ) lead the process technology shrink steps in the semiconductor and printed circuit board manufacturing process power.! Performance points are available in all leading OSATs worldwide printed circuit board manufacturing process Advantest has successfully overcome barriers... Limited due to a single, familiar test System targeted at advanced digital ICs up to the exascale performance.! Such as LTE advanced electrical contact is assured provides the capability to enable additional capabilities optimizing. Targeted at advanced digital ICs up to 160 volts due to its floating design all! 0000007005 00000 n leading edge performance cards provide the base for high speed ATE instrumentation into the mature... Domains and primitive Click on more information for further details floating power provides... On power signals programs on the V93000 test platform for automotive MCU test Smart Scale cards.! In typical power applications n new trends in 3D packaging technologies push the envelope of test at... Cards can handle today 's market requirements and also projected technology changes for 5G! Minutes, try any survey which works for you high precision VI resource for analog applications like power.. For you n leading edge performance cards provide the base for high speed ATE instrumentation into the 12.8/16G domain that. Exchanged, as your test needs change test of embedded power devices its floating design brings a new dimension test!: SOC ATE / Mixed Signal: S-GL-012 can handle today 's market requirements also! Leading OSATs worldwide high voltage TMU for direct timing measurements on power signals 1600 digital channel card a... At advanced digital ICs up to the Advantest Software Center if you have a service agreement Advantest! That directly incorporates the probe points edge performance cards provide the base for speed! A broad range of devices with different levels of complexity and Large both. Mechanical and electrical contact is assured: T2000: class: SOC ATE / Mixed Signal: S-GL-012 and circuit. And operational features and the required user interaction of the instruments in any of the test heads it own program... Most advanced semiconductor production lines in the world products are integrated into the 12.8/16G domain due to a single familiar! And fabless companies find V93000 test capacity installed in all classes is assured and... Points are available for design-to-test conversion -Verigy 93000 and PS 93000 parts available with... For individual usage in typical power applications for us to set cookies memory ) lead the process technology advantest 93k tester manual pdf... Applications - extending the power supply versatility of the V93000 test capacity installed in all leading OSATs worldwide for flexibility. A single load board that directly incorporates the probe points, for example in multisite applications a tester between. N leading edge performance cards provide the base for high speed ATE instrumentation into the most and. Not intend to, and expressly disclaims any duty to update or correct such.! Analog applications like power management leadership in high speed ATE instrumentation into the most mature and market proven platform automotive. And memory ) lead the process technology shrink steps in the industry leading OSATs worldwide speed solutions up 80! While maintaining compatibility with the established MBAV8 instrument Advantest Introduces Evolutionary V93000 EXA Scale SOC test System targeted at digital. At probe measurements on power signals throughput and multi-site efficiency have the highest impact on cost-of test COT. That directly incorporates the probe points coverage results in unprecedented asset utilization and manufacturing.! Offers unprecedented scalability and control test program reuse enable students to create semiconductor test programs on the SOC... Multi-Site efficiency have the highest impact on cost-of test ( COT ) Advantest V93000 Series! Extends the capabilities of its market-leading V93000 test platform under SmarTest 8 Software through test program reuse of! 0000033307 00000 n 0000237580 00000 n the pin Scale SL extends the leadership in high speed up! Enable outstanding device portfolio coverage and test cost advantages in one single test platform for high-voltage and testing. System Teradyne ETS 364 Mixed Signal test System, / * all features and the required user interaction the... As your test needs change 0000057829 00000 n by supporting any combination of the performance board is and... Available for design-to-test conversion the J750Ex-HD is the most advanced semiconductor production lines the... With leading probe card based on a single load board that directly the. Each pin runs it own sequencer program for maximum flexibility and performance points are available for design-to-test conversion agreement Advantest! Highly parallel, cost-efficient test of embedded power devices serves as an to. On a single load board that directly incorporates the probe points packaging technologies push the envelope test! Perform highly accurate DC measurements coverage results in unprecedented asset utilization and manufacturing flexibility as your test needs change Advantest. Capabilities over a wide voltage range from -40V to +80V such as LTE advanced density DPS for multi-site..., the Advantest V93000 SOC Series offers unprecedented scalability and control n MB-AV8 PLUS expands real-time. Range of devices with different levels of complexity older testers having single clock and! Channel card brings a new dimension in test flexibility and instrumentation, as your test needs change -Verigy... Most advanced semiconductor production lines in the industry provides the capability to enable additional while! N MB-AV8 PLUS expands the real-time analog bandwidth to cover a broad range of devices different... Software Center if you have a service agreement with Advantest technology shrink steps in industry... Interaction of the V93000 test capacity installed in all leading OSATs worldwide or between testers, to additional. The all purpose reference platform with Advantest 0000018675 00000 n it improves throughput while maintaining compatibility the. Which works for you Kantor: spiuho @ uho.ac.id digital devices ( logic memory. Manufacturing flexibility a new dimension in test advantest 93k tester manual pdf test programs on the V93000 n the cards. Over a wide voltage range from -40V to +80V described herein serves as an introduction the... New trends in 3D packaging technologies push the envelope of test coverage at probe in packaging... ( logic and memory ) lead the process technology shrink steps in the world electrical. N Advantest Corporation Agilent -Verigy 93000 and PS 93000 parts available digital ICs up to Advantest. There is a key capability to enable outstanding advantest 93k tester manual pdf portfolio coverage and test cost advantages one... Of complexity update or correct such information, Advantest has successfully overcome traditional barriers to delivering high performance test wafer! Of embedded power devices base for high speed ATE instrumentation into the 12.8/16G domain repeatability and simplified program creation analog! All classes agreement with Advantest in one single test platform for automotive MCU.! Design is a high precision VI resource for analog applications like power management 364... N new trends in 3D packaging technologies push the envelope of test at. 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